SFB 1313 Seminar: Matthijs de Winter, Utrecht University

September 18, 2018 /

On Tuesday September 18th Matthijs de Winter from Utrecht University will give a talk about his recent work with  Scanning Electron Microscopy (FIB-SEM) and electrical resistor networks. 

Dr.-Ing Matthijs de Winter is an expert in cryo-Focused Ion Beam - Scanning Electron Microscopy (FIB-SEM) and has experience with EDX, EBSD, CL, STEM-in-SEM/TSEM, TEM prep, FIB-SEM Tomography. 

The talk will be given in the MML, Pfaffenwaldring 61 at 11 a.m 

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