On Tuesday September 18th Matthijs de Winter from Utrecht University will give a talk about his recent work with Scanning Electron Microscopy (FIB-SEM) and electrical resistor networks.
Dr.-Ing Matthijs de Winter is an expert in cryo-Focused Ion Beam - Scanning Electron Microscopy (FIB-SEM) and has experience with EDX, EBSD, CL, STEM-in-SEM/TSEM, TEM prep, FIB-SEM Tomography.
The talk will be given in the MML, Pfaffenwaldring 61 at 11 a.m